EUV

基本解释

It was simultaneously observed by RHESSI at hard X-ray wavelengths, by TRACE at EUV wavelengths and by SOHO/MDI .
几乎在同一时刻;RHESSI在硬X射线波段、TRACE在极紫外波段、SOHO/MDI也观测到这一爆发事件.
Some key technologies on soft X-ray and Extreme Ultraviolet(EUV) optics developed at CIOMP are reviewed in this paper.
综述了我所软X射线-极紫外波段关键技术的研究进展。
An imaging system based on MCP (MicroChannel plate) detector is designed to image the extreme ultraviolet (EUV) light at 30.4 nm.
本文基于微通道板MCP(Microchannel Plate)探测器件设计一套成像系统;用于对波长为30.;4 nm的极紫外EUV(Extreme Ultraviolet)光进行成像
Some progress on top-down nano-fabrication, such as electron beam lithography,X-ray lithography and EUV lithography were introduced.
介绍了电子束曝光技术、EUV光刻技术和X射线光刻技术的进展;
For its part, Intel remains confident that EUV will be needed once the spacing between transistors reaches less than 50 nanometers.
但英特尔方面却依然信心十足，认为当电晶体的间距小于50奈米时，就会需要EUV。