常见例句Adams J R, Coppage F N.Field oxide inversion effects in irradiated CMOS devices.IEEE Trans Nucl Sci,1976 ; 陆妩;郭旗;任迪远等.;电离辐射对CMOS运算放大器恒流偏置电路的影响固体电子学研究与进展;2000; 返回 Coppage